Analysis of short-range order and structural model in the glassy semiconductor Ge0.20Sb0.20Se0.60 by X-ray diffraction
- Quiroga, I.
- Vázquez, J.
- Villares, P.
- Jiménez-Garay, R.
ISSN: 0167-577X
Argitalpen urtea: 1993
Alea: 17
Zenbakia: 6
Orrialdeak: 333-340
Mota: Artikulua