Cluster Tool for in Situ Processing and Comprehensive Characterization of Thin Films at High Temperatures
- Wenisch, R.
- Lungwitz, F.
- Hanf, D.
- Heller, R.
- Zscharschuch, J.
- Hübner, R.
- Von Borany, J.
- Abrasonis, G.
- Gemming, S.
- Escobar-Galindo, R.
- Krause, M.
ISSN: 1520-6882, 0003-2700
Year of publication: 2018
Volume: 90
Issue: 13
Pages: 7837-7842
Type: Article