Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum

  1. Minkov, D.
  2. Marquez, E.
  3. Angelov, G.
  4. Gavrilov, G.
  5. Ruano, S.
  6. Saugar, E.
Zeitschrift:
Materials

ISSN: 1996-1944

Datum der Publikation: 2021

Ausgabe: 14

Nummer: 16

Art: Artikel

DOI: 10.3390/MA14164681 GOOGLE SCHOLAR lock_openOpen Access editor
Datenquelle: Scopus