Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum
- Minkov, D.
- Marquez, E.
- Angelov, G.
- Gavrilov, G.
- Ruano, S.
- Saugar, E.
Aldizkaria:
Materials
ISSN: 1996-1944
Argitalpen urtea: 2021
Alea: 14
Zenbakia: 16
Mota: Artikulua