Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum

  1. Minkov, D.
  2. Marquez, E.
  3. Angelov, G.
  4. Gavrilov, G.
  5. Ruano, S.
  6. Saugar, E.
Revista:
Materials

ISSN: 1996-1944

Ano de publicación: 2021

Volume: 14

Número: 16

Tipo: Artigo

DOI: 10.3390/MA14164681 GOOGLE SCHOLAR lock_openAcceso aberto editor
Fonte de datos: Scopus