Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum

  1. Minkov, D.
  2. Marquez, E.
  3. Angelov, G.
  4. Gavrilov, G.
  5. Ruano, S.
  6. Saugar, E.
Revue:
Materials

ISSN: 1996-1944

Année de publication: 2021

Volumen: 14

Número: 16

Type: Article

DOI: 10.3390/MA14164681 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus