Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum

1. Minkov, D.
2. Marquez, E.
3. Angelov, G.
4. Gavrilov, G.
5. Ruano, S.
6. Saugar, E.

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DOI: 10.3390/MA14164681 GOOGLE SCHOLAR lock_openOpen access editor

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