Quantitative measurements of the inhomogeneous strain field of stacked self-assembled InAs/InP(001) quantum wires by the Peak Finding Method

  1. Ben, T.
  2. Molina, S. I.
  3. Garcia, R.
  4. Fuster, D.
  5. Gonzalez, M. U.
  6. Gonzalez, L.
  7. Gonzalez, Y.
  8. Kret, S.
Book Series:
MICROSCOPY OF SEMICONDUCTING MATERIALS
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989,  1867-4941

ISBN: 3-540-31914-X

Year of publication: 2005

Volume: 107

Pages: 299-302

Congress: 14th Conference on Microscopy of Semiconducting Materials

Type: Conference paper

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Data source: WoS