Quantitative measurements of the inhomogeneous strain field of stacked self-assembled InAs/InP(001) quantum wires by the Peak Finding Method

  1. Ben, T.
  2. Molina, S. I.
  3. Garcia, R.
  4. Fuster, D.
  5. Gonzalez, M. U.
  6. Gonzalez, L.
  7. Gonzalez, Y.
  8. Kret, S.
Collection de livres:
MICROSCOPY OF SEMICONDUCTING MATERIALS
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989,  1867-4941

ISBN: 3-540-31914-X

Année de publication: 2005

Volumen: 107

Pages: 299-302

Congreso: 14th Conference on Microscopy of Semiconducting Materials

Type: Communication dans un congrès

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La source de données: WoS