Quantitative measurements of the inhomogeneous strain field of stacked self-assembled InAs/InP(001) quantum wires by the Peak Finding Method

  1. Ben, T.
  2. Molina, S. I.
  3. Garcia, R.
  4. Fuster, D.
  5. Gonzalez, M. U.
  6. Gonzalez, L.
  7. Gonzalez, Y.
  8. Kret, S.
Colección de libros:
MICROSCOPY OF SEMICONDUCTING MATERIALS
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989,  1867-4941

ISBN: 3-540-31914-X

Ano de publicación: 2005

Volume: 107

Páxinas: 299-302

Congreso: 14th Conference on Microscopy of Semiconducting Materials

Tipo: Achega congreso

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Fonte de datos: WoS