Defect generation in high In and N content GaInNAs quantum wells: unfaulting of Frank dislocation loops

  1. Herrera, M.
  2. Gonzalez, D.
  3. Lozano, J. G.
  4. Hopkinson, M.
  5. Gutierrez, M.
  6. Navaretti, P.
  7. Liu, H. Y.
  8. Garcia, R.
Book Series:
Microscopy of Semiconducting Materials
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989

ISBN: 3-540-31914-X

Year of publication: 2005

Volume: 107

Pages: 139-142

Congress: 14th Conference on Microscopy of Semiconducting Materials

Type: Conference paper

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Data source: WoS