Defect generation in high In and N content GaInNAs quantum wells: unfaulting of Frank dislocation loops

  1. Herrera, M.
  2. Gonzalez, D.
  3. Lozano, J. G.
  4. Hopkinson, M.
  5. Gutierrez, M.
  6. Navaretti, P.
  7. Liu, H. Y.
  8. Garcia, R.
Collection de livres:
Microscopy of Semiconducting Materials
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989

ISBN: 3-540-31914-X

Année de publication: 2005

Volumen: 107

Pages: 139-142

Congreso: 14th Conference on Microscopy of Semiconducting Materials

Type: Communication dans un congrès