Defect generation in high In and N content GaInNAs quantum wells: unfaulting of Frank dislocation loops

  1. Herrera, M.
  2. Gonzalez, D.
  3. Lozano, J. G.
  4. Hopkinson, M.
  5. Gutierrez, M.
  6. Navaretti, P.
  7. Liu, H. Y.
  8. Garcia, R.
Liburu bilduma:
Microscopy of Semiconducting Materials
  1. Cullis, AG (coord.)
  2. Hutchison, JL (coord.)

ISSN: 0930-8989

ISBN: 3-540-31914-X

Argitalpen urtea: 2005

Alea: 107

Orrialdeak: 139-142

Biltzarra: 14th Conference on Microscopy of Semiconducting Materials

Mota: Biltzar ekarpena

GOOGLE SCHOLAR
Datuen iturria: WoS