Publicaciones en las que colabora con PEDRO LUIS GALINDO RIAÑO (23)

2020

  1. CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

    Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920

2019

  1. Topological homogeneity for electron microscopy images

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

2018

  1. Application of super-resolution techniques to transmission electron microscopy images

    Frontiers in Artificial Intelligence and Applications

  2. Correcting sample drift using Fourier harmonics

    Micron, Vol. 110, pp. 18-27

2017

  1. Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

    Ultramicroscopy, Vol. 182, pp. 283-291

2016

  1. Strain mapping accuracy improvement using super-resolution techniques

    Journal of Microscopy, Vol. 262, Núm. 1, pp. 50-58

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

2009

  1. Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

    Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12

  2. High resolution electron microscopy of GaAs capped GaSb nanostructures

    Applied Physics Letters, Vol. 94, Núm. 4

2008

  1. A method to determine the strain and nucleation sites of stacked nano-objects

    Journal of Nanoscience and Nanotechnology, Vol. 8, Núm. 7, pp. 3422-3426

  2. Experimental and simulated strain field maps in stacked quantum wires

    Microscopy and Microanalysis

  3. High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells

    Microscopy and Microanalysis

2007

  1. Critical strain region evaluation of self-assembled semiconductor quantum dots

    Nanotechnology, Vol. 18, Núm. 47

  2. Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images

    Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

  3. Direct imaging of quantum wires nucleated at diatomic steps

    Applied Physics Letters, Vol. 91, Núm. 14

  4. Error quantification in strain mapping methods

    Microscopy and Microanalysis, Vol. 13, Núm. 5, pp. 320-328

  5. Incorporation of Sb in InAsGaAs quantum dots

    Applied Physics Letters, Vol. 91, Núm. 26

  6. The Peak Pairs algorithm for strain mapping from HRTEM images

    Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193

2006

  1. Determination of the strain generated in InAs/InP quantum wires: Prediction of nucleation sites

    Nanotechnology, Vol. 17, Núm. 22, pp. 5652-5658

2005

  1. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    14th Conference, April 11-14, 2005, Oxford, UK