Publications by the researcher in collaboration with TERESA BEN FERNANDEZ (7)

2016

  1. (S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications

    Microscopy and Microanalysis

2009

  1. High resolution electron microscopy of GaAs capped GaSb nanostructures

    Applied Physics Letters, Vol. 94, Núm. 4

2007

  1. Error quantification in strain mapping methods

    Microscopy and Microanalysis, Vol. 13, Núm. 5, pp. 320-328

  2. The Peak Pairs algorithm for strain mapping from HRTEM images

    Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193

2005

  1. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    14th Conference, April 11-14, 2005, Oxford, UK

  2. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    MICROSCOPY OF SEMICONDUCTING MATERIALS

  3. Strain mapping from HRTEM images

    MICROSCOPY OF SEMICONDUCTING MATERIALS