Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas-ko ikertzaileekin lankidetzan egindako argitalpenak (15)

2024

  1. Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity

    Coatings, Vol. 14, Núm. 1

2023

  1. Complex dielectric function of H-free a-Si films: Photovoltaic light absorber

    Materials Letters, Vol. 345

  2. Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample

    Nanomaterials, Vol. 13, Núm. 17

  3. Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber

    Coatings, Vol. 13, Núm. 7

2022

  1. Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films

    Coatings, Vol. 12, Núm. 10

  2. Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si

    Journal of Non-Crystalline Solids, Vol. 594

2021

  1. Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum

    Materials, Vol. 14, Núm. 16

  2. Optical characterization of H-free a-Si layers grown by rf-magnetron sputtering by inverse synthesis using matlab: Tauc–lorentz–urbach parameterization

    Coatings, Vol. 11, Núm. 11

2020

  1. Spectroscopic ellipsometry study of non-hydrogenated fully amorphous silicon films deposited by room-temperature radio-frequency magnetron sputtering on glass: Influence of the argon pressure

    Journal of Non-Crystalline Solids, Vol. 547

2019

  1. The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates

    Journal of Non-Crystalline Solids, Vol. 517, pp. 32-43

2018

  1. Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum

    Thin Solid Films, Vol. 645, pp. 370-378

2017

  1. Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens

    Optik, Vol. 132, pp. 320-328

2016

  1. Accurate characterization of film on substrate transmitting specimens by the envelope method

    2016 25th International Scientific Conference Electronics, ET 2016

2005

  1. Optical and structural characterisation of single and multilayer germanium/silicon monoxide systems

    Thin Solid Films, Vol. 485, Núm. 1-2, pp. 274-283

1999

  1. Optical properties of thin-film ternary Ge10As15Se75 chalcogenide glasses

    Materials Letters, Vol. 39, Núm. 4, pp. 232-239