Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Institut d'investigació
Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas
Madrid, EspañaPublicacions en col·laboració amb investigadors/es de Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas (20)
2024
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Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity
Coatings, Vol. 14, Núm. 1
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Synthesis and Characterization of Multilayered CrAlN/Al2O3 Tandem Coating Using HiPIMS for Solar Selective Applications at High Temperature
ACS Applied Energy Materials, Vol. 7, Núm. 2, pp. 438-449
2023
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Complex dielectric function of H-free a-Si films: Photovoltaic light absorber
Materials Letters, Vol. 345
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Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample
Nanomaterials, Vol. 13, Núm. 17
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Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber
Coatings, Vol. 13, Núm. 7
2022
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Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films
Coatings, Vol. 12, Núm. 10
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Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si
Journal of Non-Crystalline Solids, Vol. 594
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Ni-Ce-ZrO2 system as anode material for direct internal reforming biogas solid oxide fuel cells
Fuel, Vol. 322
2021
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Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum
Materials, Vol. 14, Núm. 16
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Optical characterization of H-free a-Si layers grown by rf-magnetron sputtering by inverse synthesis using matlab: Tauc–lorentz–urbach parameterization
Coatings, Vol. 11, Núm. 11
2020
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Performance of a direct methane solid oxide fuel cell using nickel-ceria-yttria stabilized zirconia as the anode
Materials, Vol. 13, Núm. 3
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Spectroscopic ellipsometry study of non-hydrogenated fully amorphous silicon films deposited by room-temperature radio-frequency magnetron sputtering on glass: Influence of the argon pressure
Journal of Non-Crystalline Solids, Vol. 547
2019
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The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates
Journal of Non-Crystalline Solids, Vol. 517, pp. 32-43
2018
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Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum
Thin Solid Films, Vol. 645, pp. 370-378
2017
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Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens
Optik, Vol. 132, pp. 320-328
2016
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Accurate characterization of film on substrate transmitting specimens by the envelope method
2016 25th International Scientific Conference Electronics, ET 2016
2012
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Infrared photoluminescence of high In-content InN/InGaN multiple-quantum-wells
Physica Status Solidi (A) Applications and Materials Science, Vol. 209, Núm. 1, pp. 17-20
2006
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Influence of Sn4+ on the structural and electronic properties of Ti1-xSnxO2 nanoparticles used as photocatalysts
Physical Chemistry Chemical Physics, Vol. 8, Núm. 20, pp. 2421-2430
2005
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Optical and structural characterisation of single and multilayer germanium/silicon monoxide systems
Thin Solid Films, Vol. 485, Núm. 1-2, pp. 274-283
1999
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Optical properties of thin-film ternary Ge10As15Se75 chalcogenide glasses
Materials Letters, Vol. 39, Núm. 4, pp. 232-239