Instituto de Microscopía Electrónica y Materiales (IMEYMAT)

1999

1. Application of a fractionary factorial design to the determination of tin in lubricating oils by continuous flow hydride generation-atomic absorption spectrometry

   Fresenius' Journal of Analytical Chemistry, Vol. 364, Núm. 6, pp. 527-532

2. Calculation and analysis of the complex refractive index of uniform films of the As-S-Se glassy alloy deposited by thermal evaporation

   Surface and Coatings Technology, Vol. 122, Núm. 1, pp. 60-66

3. Carbon nitride nanocomposites: Formation of aligned CxNy Nanofibers

   Advanced Materials, Vol. 11, Núm. 8, pp. 655-658

4. Cathodoluminescence study of pyramidal facets in piezoelectric InGaAs/GaAs multiple quantum well pin photodiodes

   Microelectronics Journal, Vol. 30, Núm. 4, pp. 427-431

5. Cerium-terbium mixed oxides as alternative components for three-way catalysts: A comparative study of Pt/CeTbOx and Pt/CeO2 model systems

   Catalysis Today, Vol. 53, Núm. 4, pp. 607-612

6. Characterization of La2O3/SiO2 mixed oxide catalyst supports

   Journal of Catalysis, Vol. 183, Núm. 1, pp. 53-62

7. Detailed defect study in proton irradiated InP/Si solar cells

   Journal of Applied Physics, Vol. 86, Núm. 7, pp. 3584-3589

8. Detection and quantification of small misalignments in nanometer-sized particles on oxide support systems by the analysis of plan view HREM images

   Electron Microscopy and Analysis Group Cont EMAG99, Sheffield

9. Determination of the complex refractive index of thermally evaporated thin films of binary chalcogenide glasses by reflectance measurements

   Physics and Chemistry of Glasses, Vol. 40, Núm. 1, pp. 18-25

10. Determination of wear metals in marine lubricating oils by microwave digestion and atomic absorption spectrometry

    Mikrochimica Acta, Vol. 132, Núm. 1, pp. 89-94

11. Effect of In-content on the misfit dislocation interaction in InGaAs/GaAs layers

    Thin Solid Films, Vol. 343-344, Núm. 1-2, pp. 302-304

12. Effect of the temperature ramp rate during carbonization of Si (111) on the crystalline quality of SiC produced

    MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS

13. Electrochemical production of low-melting metal nanowires

    Chemical Physics Letters, Vol. 301, Núm. 1-2, pp. 159-166

14. Electrolytic formation of carbon-sheathed mixed Sn-Pb nanowires

    Chemistry of Materials, Vol. 11, Núm. 7, pp. 1747-1751

15. Electron energy-loss spectroscopy (EELS) on nano-dimensional structures

    Journal of Electron Microscopy

16. Electron microscopy study of SiC obtained by the carbonization of Si(111)

    Thin Solid Films, Vol. 343-344, Núm. 1-2, pp. 305-308

17. Failure analysis of heavily proton irradiated p+-n InGaP solar cells by EBIC and cathodoluminescence

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 66, Núm. 1, pp. 189-193

18. Growth of III-nitrides on Si(1 1 1) by molecular beam epitaxy. Doping, optical, and electrical properties

    Journal of Crystal Growth, Vol. 201, pp. 296-317

19. Growth rate and critical temperatures to avoid the modulation of composition of InGaAs epitaxial layers

    Applied Physics Letters, Vol. 74, Núm. 18, pp. 2649-2651

20. HREM analysis of the nanostructure/oxygen buffering capacity relationship in a Rh/CeTbOx catalyst

    ELECTRON MICROSCOPY AND ANALYSIS 1999