Comprehensive (S)TEM characterization of polycrystalline GaN/AlN layers grown on LTCC substrates

  1. Jiménez, J.J.
  2. Mánuel, J.M.
  3. Bartsch, H.
  4. Breiling, J.
  5. García, R.
  6. Jacobs, H.O.
  7. Müller, J.
  8. Pezoldt, J.
  9. Morales, F.M.
Journal:
Ceramics International

ISSN: 0272-8842

Year of publication: 2019

Volume: 45

Issue: 7

Pages: 9114-9125

Type: Article

DOI: 10.1016/J.CERAMINT.2019.01.250 GOOGLE SCHOLAR
Data source: Scopus