Comprehensive (S)TEM characterization of polycrystalline GaN/AlN layers grown on LTCC substrates

  1. Jiménez, J.J.
  2. Mánuel, J.M.
  3. Bartsch, H.
  4. Breiling, J.
  5. García, R.
  6. Jacobs, H.O.
  7. Müller, J.
  8. Pezoldt, J.
  9. Morales, F.M.
Revue:
Ceramics International

ISSN: 0272-8842

Année de publication: 2019

Volumen: 45

Número: 7

Pages: 9114-9125

Type: Article

DOI: 10.1016/J.CERAMINT.2019.01.250 GOOGLE SCHOLAR
La source de données: Scopus