Publicaciones en las que colabora con JOAQUIN PIZARRO JUNQUERA (15)

2020

  1. Investigation on Sb distribution for InSb/InAs sub-monolayer heterostructure using TEM techniques

    Nanotechnology, Vol. 31, Núm. 2

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

2009

  1. Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs

    Physical Review B - Condensed Matter and Materials Physics, Vol. 80, Núm. 12

2008

  1. A method to determine the strain and nucleation sites of stacked nano-objects

    Journal of Nanoscience and Nanotechnology, Vol. 8, Núm. 7, pp. 3422-3426

  2. Experimental and simulated strain field maps in stacked quantum wires

    Microscopy and Microanalysis

  3. High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells

    Microscopy and Microanalysis

2007

  1. Critical strain region evaluation of self-assembled semiconductor quantum dots

    Nanotechnology, Vol. 18, Núm. 47

  2. Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images

    Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

  3. Direct imaging of quantum wires nucleated at diatomic steps

    Applied Physics Letters, Vol. 91, Núm. 14

  4. The Peak Pairs algorithm for strain mapping from HRTEM images

    Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193

2006

  1. Determination of the strain generated in InAs/InP quantum wires: Prediction of nucleation sites

    Nanotechnology, Vol. 17, Núm. 22, pp. 5652-5658

2005

  1. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    14th Conference, April 11-14, 2005, Oxford, UK

  2. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    MICROSCOPY OF SEMICONDUCTING MATERIALS

  3. Strain mapping from HRTEM images

    MICROSCOPY OF SEMICONDUCTING MATERIALS

2003

  1. On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images

    10th International Ceramics Congress and 3rd Forum on New Materials, Florence, Italy, July 14-18, 2002