Física de la Materia Condensada
Departamento
Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas
Madrid, EspañaPublicaciones en colaboración con investigadores/as de Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas (15)
2024
2023
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Complex dielectric function of H-free a-Si films: Photovoltaic light absorber
Materials Letters, Vol. 345
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Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample
Nanomaterials, Vol. 13, Núm. 17
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Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber
Coatings, Vol. 13, Núm. 7
2022
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Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films
Coatings, Vol. 12, Núm. 10
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Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si
Journal of Non-Crystalline Solids, Vol. 594
2021
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Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum
Materials, Vol. 14, Núm. 16
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Optical characterization of H-free a-Si layers grown by rf-magnetron sputtering by inverse synthesis using matlab: Tauc–lorentz–urbach parameterization
Coatings, Vol. 11, Núm. 11
2020
2019
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The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates
Journal of Non-Crystalline Solids, Vol. 517, pp. 32-43
2018
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Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum
Thin Solid Films, Vol. 645, pp. 370-378
2017
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Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens
Optik, Vol. 132, pp. 320-328
2016
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Accurate characterization of film on substrate transmitting specimens by the envelope method
2016 25th International Scientific Conference Electronics, ET 2016
2005
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Optical and structural characterisation of single and multilayer germanium/silicon monoxide systems
Thin Solid Films, Vol. 485, Núm. 1-2, pp. 274-283
1999
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Optical properties of thin-film ternary Ge10As15Se75 chalcogenide glasses
Materials Letters, Vol. 39, Núm. 4, pp. 232-239