Publicaciones en colaboración con investigadores/as de Universidad Autónoma de Madrid (8)

2016

  1. Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction

    Scientific Reports, Vol. 6

2015

  1. Analysis of the stability of InGaN/GaN multiquantum wells against ion beam intermixing

    Nanotechnology, Vol. 26, Núm. 42

  2. Quantitative Chemical Mapping of InGaN Quantum Wells from Calibrated High-Angle Annular Dark Field Micrographs

    Microscopy and Microanalysis, Vol. 21, Núm. 4, pp. 994-1005

2004

  1. Crystalline inclusions formed in C + N + BF2 coimplanted on silicon (111)

    Microchimica Acta

2003

  1. N + BF2 and N + C + BF2 high-dose co-implantation in silicon

    Applied Physics A: Materials Science and Processing, Vol. 76, Núm. 5, pp. 791-800

  2. Transmission electron microscopy study of simultaneous high-dose C+ + N+ co-implantation into (1 1 1)Si

    Thin Solid Films, Vol. 426, Núm. 1-2, pp. 16-30

  3. Transmission electron microscopy study of ultra-thin SiC layers obtained by rapid thermal carbonization of Si wafers

    Physica Status Solidi (A) Applied Research

2001

  1. Structural characterization of high-dose C++N+ ion-implanted (1 1 1) Si

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 184, Núm. 3, pp. 361-370