Enrique
Calleja Pardo
Enrique Calleja Pardo-rekin lankidetzan egindako argitalpenak (18)
2003
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Structural Study of GaN Layers Grown on Carbonized Si(111) Substrates
Materials Science Forum
2002
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AlN buffer layer thickness influence on inversion domains in GaN/AlN/Si(1 1 1)
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
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Correlation between the AlN buffer layer thickness and the GaN polarity in GaN/AlN/Si(111) grown by MBE
Materials Research Society Symposium - Proceedings
2001
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Inversion domains in GaN layers grown on (111) silicon by molecular-beam epitaxy
Applied Physics Letters, Vol. 78, Núm. 18, pp. 2688-2690
1999
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Growth of III-nitrides on Si(1 1 1) by molecular beam epitaxy. Doping, optical, and electrical properties
Journal of Crystal Growth, Vol. 201, pp. 296-317
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Influence of Si doping on the subgrain structure of GaN grown on AlN/Si(111)
Physica Status Solidi (A) Applied Research, Vol. 176, Núm. 1, pp. 401-406
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MBE growth of GaN and AlGaN layers on Si(1 1 1) substrates: Doping effects
Journal of Crystal Growth, Vol. 201, pp. 415-418
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Properties of homoepitaxial and heteroepitaxial GaN layers grown by plasma-assisted MBE
Physica Status Solidi (A) Applied Research, Vol. 176, Núm. 1, pp. 447-452
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The effect of Si doping on the defect structure of GaN/AIN/Si(111)
Applied Physics Letters, Vol. 74, Núm. 22, pp. 3362-3364
1998
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Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs
Materials Science and Technology, Vol. 14, Núm. 12, pp. 1273-1278
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Relaxation mechanism of InGaAs single and graded layers grown on (111)B GaAs
Thin Solid Films, Vol. 317, Núm. 1-2, pp. 270-273
1997
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Influence of the surface morphology on the relaxation of low-strained InxGa1 - xAs linear buffer structures
Journal of Crystal Growth, Vol. 182, Núm. 3-4, pp. 281-291
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Structural study of AlGaAs/InGaAs superlattices grown by MBE on (111)B GaAs substrates
Materials Science and Engineering B, Vol. 44, Núm. 1-3, pp. 106-109
1995
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Design of InGaAs linear graded buffer structures
Applied Physics Letters, pp. 3334
1994
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Dislocation distribution in graded composition InGaAs layers
Materials Research Society Symposium Proceedings
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Step-graded buffer layer study of the strain relaxation by transmission electron microscopy
Materials Science and Engineering B, Vol. 28, Núm. 1-3, pp. 497-501
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Strain relief in linearly graded composition buffer layers: A design scheme to grow dislocation-free (<105 cm-2) and unstrained epilayers
Applied Physics Letters, Vol. 65, Núm. 19, pp. 2460-2462
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Transmission electron microscopy study of InxGa1-xAs/GaAs multilayer buffer structures used as dislocation filters
Materials Science and Engineering B, Vol. 28, Núm. 1-3, pp. 515-519